Strain-Induced Increase of Dielectric Constant in EuO Thin Film
نویسندگان
چکیده
منابع مشابه
Thickness and dielectric constant determination of thin dielectric layers
We derive a method for the determination of the dielectric constant and thickness of a thin dielectric layer, deposited on top of a thick dielectric layer which is in turn present on a metal film. Reflection of pand s-polarlzed light from the metal layer yields minima for certain angles of incidence where the light is absorbed by the metal. The thin dielectric layer causes shifts in the angles ...
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ژورنال
عنوان ژورنال: Materials Research Express
سال: 2019
ISSN: 2053-1591
DOI: 10.1088/2053-1591/ab405a